Research on key technologies of PMIC parameter testing based on ATE

WEN Zhixian; YANG Hongliang; CHU Fumiao

doi:10.20193/j.ices2097-4191.2024.0063

PDF(6143 KB)

Integrated Circuits and Embedded Systems ›› 2025, Vol. 25 ›› Issue (4) : 72-78. DOI: 10.20193/j.ices2097-4191.2024.0063

Research Paper

Research on key technologies of PMIC parameter testing based on ATE

Author information +

History +

Abstract

This paper proposes a simulation chip performance testing scheme based on Huafeng's STS8200, using the UC3842 chip as an example. The paper investigates the testing methods and procedures for several important parameters of the chip, including reference voltage, load regulation, line regulation, oscillator frequency, and rise and fall time.The experimental verification showed that the results of each parameter were within the effective value range. After testing 10 chips and performing a 100-loop test on the 10th chip, the test yield of the chip was 100%, demonstrating the validity and effectiveness of the testing scheme.

Key words

PMIC / ATE / performance testing / test data analysis / STS8200

Cite this article

EndNote

Ris (Procite)

Bibtex

Download Citations

WEN Zhixian , YANG Hongliang , CHU Fumiao. Research on key technologies of PMIC parameter testing based on ATE[J]. Integrated Circuits and Embedded Systems. 2025, 25(4): 72-78 https://doi.org/10.20193/j.ices2097-4191.2024.0063

References

List( Publishing order | Descend order by publishing year | Descend order by cited within ) Chart analysis

[1]	张倩. 集成电路产业的发展现状与趋势研究[J]. 集成电路应用, 2019, 36(9):1-3. ZHANG Q. Research on the Current Situation and Trends of the Integrated Circuit Industry[J]. Integrated Circuit Applications, 2019, 36(9):1-3 (in Chinese). Cited in this article [1]

[2]	张松鹤. 基于ATE的低成本测试方案的设计与实现[D]. 南京: 东南大学, 2012. ZHANG S H. Design and implementation of low-cost test scheme based on ATE[D]. Nanjing: Southeast University, 2012 (in Chinese). Cited in this article [1]

[3]	郭瑞振, 李定学. 集成电路测试机发展简史[J]. 集成电路应用, 2001(3):18,46. GUO R Z, LI D X. A Brief History of the Development of Integrated Circuit Testers[J]. Integrated Circuit Application, 2001(3):18,46 (in Chinese). Cited in this article [1]

[4]	潘曙娟, 钟杰. 基于ATE的IC测试原理,方法及故障分析[J]. 半导体学报, 2006, 27(13):354-357. PAN S J, ZHONG J. IC test principle,method and fault analysis based on ATE[J]. Journal of Semiconductors, 2006, 27(13):354-357 (in Chinese). Cited in this article [1]

[5]	杨旭, 裴元庆, 王兆安. 开关电源技术[M]. 北京: 机械工业出版社,2004:61-125. YANG X, PEI Y Q, WANG Z A. Switched-mode Power Supply Technology[M]. Beijing: China Machine Press,2004:61-125 (in Chinese). Cited in this article [1]

[6]	王东林. 集成电路自动测试方法的探讨与分析[J]. 电子世界, 2017(9):131. WANG D L. Discussion and analysis of automatic test method for integrated circuit[J]. Electronic World, 2017(9):131 (in Chinese). Cited in this article [2]

[7]	李永梅. 电压控制型脉宽调制(PWM)器件电参数的全面测试[J]. 宇航计测技术, 2006, 26(5):2-5. LI Y M. Comprehensive test of electrical parameters of voltage-controlled pulse-width modulation(PWM) device[J]. Aerospace Measurement Technology, 2006, 26(5):2-5 (in Chinese). Cited in this article [1]

[8]	BROWN A, JOHNSON M. Systematic Approaches to ATE-Based Testing[J]. Journal of Electronic Testing, 2019, 35(4):456-467. Cited in this article [1]

[9]	PATEL. Defining Test Metrics and Methods for Semiconductor Devices[J]. Journal of Semiconductor Technology, 2022, 47(1):34-42. Cited in this article [1]

[10]	北京华峰. STS8200硬件手册Rev 3.9,2023. Beijing Huafeng. STS8200 Hardware Manual Rev 3.9,2023 (in Chinese). Cited in this article [1]

[11]	李淼. PMIC自动化测试平台的设计与实现[D]. 成都: 成都理工大学, 2018. LI M. Design and implementation of PMIC automated test platform[D]. Chengdu: Chengdu University of Technology, 2018 (in Chinese). Cited in this article [1]

[12]	北京华峰. STS8200编程手册Rev3.69,2023. Beijing Huafeng. STS8200 Programming Manual Rev3.69,2023 (in Chinese). Cited in this article [1]

[13]	王辉. 集成电路测试技术的应用研究[J]. 电子世界, 2018(4):64-66. WANG H. Research on the application of integrated circuit testing technology[J]. Electronic World, 2018(4):64-66 (in Chinese). Cited in this article [1]

[14]

UC3842电源管理芯片详细解读[EB/OL].(2022-05-13)[2024-10-22]. https://blog.csdn.net/ice_cream23333/article/details/124391921.

https://blog.csdn.net/ice_cream23333/article/details/124391921

UC3842 Power Management Chip DetailedInterpretation[EB/OL].(2022-05-13)[2024-10-22]. https://blog.csdn.net/ice_cream23333/article/details/124391921 (in Chinese).

https://blog.csdn.net/ice_cream23333/article/details/124391921

Cited in this article [1]