Research on key technologies of PMIC parameter testing based on ATE

WEN Zhixian, YANG Hongliang, CHU Fumiao

Integrated Circuits and Embedded Systems ›› 2025, Vol. 25 ›› Issue (4) : 72-78.

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Integrated Circuits and Embedded Systems ›› 2025, Vol. 25 ›› Issue (4) : 72-78. DOI: 10.20193/j.ices2097-4191.2024.0063
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Research on key technologies of PMIC parameter testing based on ATE

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2025, 25(4): 72-78 https://doi.org/10.20193/j.ices2097-4191.2024.0063

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