Reliability study and modelling development of FinFET devices

WANG Yubo, LIU Fang, CAO Yongwan, YU Wen, ZHANG Tong, ZHU Yaxing, DING Guojing, LIANG Yingzong

Integrated Circuits and Embedded Systems ›› 2025, Vol. 25 ›› Issue (5) : 66-74.

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Integrated Circuits and Embedded Systems ›› 2025, Vol. 25 ›› Issue (5) : 66-74. DOI: 10.20193/j.ices2097-4191.2025.0008
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Reliability study and modelling development of FinFET devices

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2025, 25(5): 66-74 https://doi.org/10.20193/j.ices2097-4191.2025.0008

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