电磁干扰环境MOS器件可靠性表征方法研究
朱亚星, 赵东艳, 陈燕宁, 刘芳, 吴波, 王凯, 郁文, 王柏清, 宋斌斌, 连亚军
集成电路与嵌入式系统 ›› 2024, Vol. 24 ›› Issue (8) : 29-34.
电磁干扰环境MOS器件可靠性表征方法研究
Research on reliability characterization method for MOS devices under electromagnetic interference environment
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