基于ATE的PMIC参数测试关键技术研究

温志贤, 杨红亮, 褚夫邈

集成电路与嵌入式系统 ›› 0

集成电路与嵌入式系统 ›› 0 DOI: 10.20193/j.ices2097-4191.2024.0063

基于ATE的PMIC参数测试关键技术研究

  • 温志贤, 杨红亮, 褚夫邈
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Research on key technologies of PMIC parameter testing based on ATE

  • 温, 志 贤
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摘要

在芯片工程化量产前需要对芯片进行全面的电路性能检测,筛选符合要求的芯片,避免不合格的芯片流入市场。PMIC(Power Management IC)即电源管理芯片,通过内置DC-DC转换器、电流控制、保护机制等功能,实现了电源转换、功率转换、电流控制等多种功能。因此必须要考虑芯片技术指标是否符合使用要求。本文以UC3842芯片为例,提出了一种基于华峰公司STS8200的模拟芯片性能测试方案。文章对芯片的几个部分重要参数(基准电压、负载调整率、线性调整率、振荡器频率、上升沿与下降沿时间等)的测试方法和测试程序进行了研究。最终通过实验验证,各个参数的实验结果均在有效值范围以内,结果表明在测试了10颗芯片并对第10颗芯片进行LOOP100次后,芯片的测试良率为100%。说明了测试方案真实有效。

Abstract

Before the mass production of chip engineering, it is necessary to conduct a comprehensive circuit performance test on the chip, screen the chips that meet the requirements, and avoid unqualified chips from entering the market. PMIC (Power Management IC) is a power management chip that realizes a variety of functions such as power conversion, power conversion, and current control through built-in DC-DC converters, current control, and protection mechanisms. Therefore, it is necessary to consider whether the technical indicators of the chip meet the requirements of use. In this paper, taking the UC3842 chip as an example, an analog chip performance test scheme based on Huafon STS8200 is proposed. In this paper, the test methods and test procedures of several important parameters of the chip (reference voltage, load regulation, linear regulation, oscillator frequency, rising and falling edge time, etc.) are studied. Finally, the experimental results of each parameter are within the range of effective values, and the results show that after testing 10 chips and LOOP100 the 10th chip, the test yield of the chip is 100%. It shows that the test scheme is real and effective.

关键词

PMIC / ATE / 性能测试 / 测试数据分析

Key words

PMIC / ATE / performance testing / test data analysis

引用本文

导出引用
温志贤, 杨红亮, 褚夫邈. 基于ATE的PMIC参数测试关键技术研究[J]. 集成电路与嵌入式系统, 0 https://doi.org/10.20193/j.ices2097-4191.2024.0063
温, 志 贤. Research on key technologies of PMIC parameter testing based on ATE[J]. Integrated Circuits and Embedded Systems, 0 https://doi.org/10.20193/j.ices2097-4191.2024.0063

基金

126kV环保型高压气体绝缘开关的研发(CYZC-2024-58)

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