Before the mass production of chip engineering, it is necessary to conduct a comprehensive circuit performance test on the chip, screen the chips that meet the requirements, and avoid unqualified chips from entering the market. PMIC (Power Management IC) is a power management chip that realizes a variety of functions such as power conversion, power conversion, and current control through built-in DC-DC converters, current control, and protection mechanisms. Therefore, it is necessary to consider whether the technical indicators of the chip meet the requirements of use. In this paper, taking the UC3842 chip as an example, an analog chip performance test scheme based on Huafon STS8200 is proposed. In this paper, the test methods and test procedures of several important parameters of the chip (reference voltage, load regulation, linear regulation, oscillator frequency, rising and falling edge time, etc.) are studied. Finally, the experimental results of each parameter are within the range of effective values, and the results show that after testing 10 chips and LOOP100 the 10th chip, the test yield of the chip is 100%. It shows that the test scheme is real and effective.
温, 志 贤.
Research on key technologies of PMIC parameter testing based on ATE[J]. Integrated Circuits and Embedded Systems, 0 https://doi.org/10.20193/j.ices2097-4191.2024.0063