基于ATE的PMIC参数测试关键技术研究

温志贤; 杨红亮; 褚夫邈

doi:10.20193/j.ices2097-4191.2024.0063

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集成电路与嵌入式系统 ›› 2025, Vol. 25 ›› Issue (4) : 72-78. DOI: 10.20193/j.ices2097-4191.2024.0063

研究论文

基于ATE的PMIC参数测试关键技术研究

作者信息 +

Research on key technologies of PMIC parameter testing based on ATE

Author information +

文章历史 +

摘要

以UC3842芯片为例,提出了一种基于华峰公司STS8200的模拟芯片性能测试方案。本文对芯片的几个重要参数(基准电压、负载调整率、线性调整率、振荡器频率、上升沿与下降沿时间等)的测试方法和测试程序进行了研究。最终通过实验验证,各个参数的实验结果均在有效值范围以内。实验结果表明,在测试了10颗芯片并对第10颗芯片进行LOOP 100次后,芯片的测试良率为100%,说明测试方案真实有效。

Abstract

This paper proposes a simulation chip performance testing scheme based on Huafeng's STS8200, using the UC3842 chip as an example. The paper investigates the testing methods and procedures for several important parameters of the chip, including reference voltage, load regulation, line regulation, oscillator frequency, and rise and fall time.The experimental verification showed that the results of each parameter were within the effective value range. After testing 10 chips and performing a 100-loop test on the 10th chip, the test yield of the chip was 100%, demonstrating the validity and effectiveness of the testing scheme.

导出引用

温志贤, 杨红亮, 褚夫邈. 基于ATE的PMIC参数测试关键技术研究[J]. 集成电路与嵌入式系统. 2025, 25(4): 72-78 https://doi.org/10.20193/j.ices2097-4191.2024.0063

WEN Zhixian, YANG Hongliang, CHU Fumiao. Research on key technologies of PMIC parameter testing based on ATE[J]. Integrated Circuits and Embedded Systems. 2025, 25(4): 72-78 https://doi.org/10.20193/j.ices2097-4191.2024.0063

中图分类号： TP34

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