![](/develop/static/common/images/pdf.png)
功率MOSFET抗单粒子加固技术研究
陈宝忠, 宋坤, 王英民, 刘存生, 王小荷, 赵辉, 辛维平, 杨丽侠, 邢鸿雁, 王晨杰
集成电路与嵌入式系统 ›› 2024, Vol. 24 ›› Issue (3) : 19-22.
功率MOSFET抗单粒子加固技术研究
Investigation on radiation-hardened technology of single event effect for power MOSFETs
{{custom_editor}},
{{custom_ref.label}} |
{{custom_citation.content}}
{{custom_citation.annotation}}
|
/
〈 |
|
〉 |