偏置电压和温度对22 nm FDSOI器件单粒子瞬态的影响研究
	
	
		黄潇枫, 李臣明, 王海滨, 孙永姝, 王亮, 郭刚, 汪学明
	
	
	
		Bias voltage and temperature dependence of single-event transient in 22 nm FDSOI devices
	
	
		HUANG  Xiaofeng, LI  Chenming, WANG  Haibin, SUN  Yongshu, WANG  Liang, GUO  Gang, WANG  Xueming
	
	
	
	集成电路与嵌入式系统
	. 
	
	2024, (7): 30
	
	-36
	
	
	.