在高分辨率模/数转换器(ADC)设计中,由于工艺变化导致的电容失配对精度有很大影响,业内为了解决这一问题提出了许多补偿方法,但通常需要添加额外的电路或外部控制器,增大了硅片面积和操作复杂度。本文分析并确定了电容失配、输出偏差和总谐波失真(THD)在电容型数/模转换器(DAC)中的关系,并推导出THD在特定失配条件下的分布情况,可用于评估ADC在电容失配下的性能边界。在此基础上,本文提出了一种采用动态元素匹配(DEM)技术的新型补偿方法,并以最小的硬件成本在循环型流水线ADC中实现,流片测试结果证实了理论的有效性并展示了DEM算法的鲁棒性,这项工作对于高精度ADC设计的性能评估具有重要参考意义。
The inherent capacitor mismatch resulting from process variations is a significant impediment in the designing of high-resolution Analog-to-Digital Converters. Various calibration methods have been previously introduced, often employing additional circuits or external controllers, albeit at the expense of increased silicon area or intricate operational complexities. In this work, we have established the relationship between capacitor mismatches, output deviation, and Total Harmonic Distortion (THD) in capacitor Digital-to-Analog Converters. Consequently, the statistical distribution of expected THD under certain mismatch can be derived. After that, we propose a new compensation strategy that adopts the Dynamic Element Matching (DEM) technique to conventional cyclic ADCs with minimum hardware cost and implement this compensation scheme in a cyclic-pipelined ADC. We reassess the performance of the proposed ADC based on the formulated theory. Importantly, the measurement results of the cyclic ADC have not only confirmed the validity of our proposed theory but also demonstrated the robust performance of the simplified version of the DEM algorithm. This work is constructive for performance estimation in other high-precision ADC designs.