针对传统MOSFET测试流程繁琐、依赖大型仪器且智能化程度低等难题，本文设计了一套集成大语言模型（LLM）与“雨珠S”便携硬件的自动化测试系统。该系统以“雨珠S”仪器为核心，通过一体化PCB载板实现特性曲线、开关时间和双脉冲测试，并创新性地利用Gemini API赋能软件，实现PDF数据手册自动解析、测试参数智能推荐与测试结果的深度误差分析。对IRF7401器件的测试结果表明，系统获取的关键动静态参数与数据手册及仿真值吻合良好，验证了该测试方案的准确性与可行性。本研究为终端用户进行器件性能评估提供了一种高效、智能的便携式新方法。

To address the challenges of traditional MOSFET testing, such as cumbersome procedures, reliance on bulky instruments, and a low degree of intelligence, this paper presents an automated test system integrating a Large Language Model (LLM) with the "Yuzhu S" portable hardware. Centered around the "Yuzhu S" instrument, the system performs characteristic curve, switching time, and double-pulse tests using an integrated PCB carrier board. It innovatively leverages the Gemini API to empower the software, enabling automatic parsing of PDF datasheets, intelligent recommendation of test parameters, and in-depth error analysis of the results. The test results for an IRF7401 device demonstrate that the key static and dynamic parameters obtained by the system show excellent agreement with datasheet specifications and simulation values, thus validating the accuracy and feasibility of the proposed solution. This research provides an efficient, intelligent, and portable new method for end-users to evaluate device performance.