针对GJB/Z 299D-2024“电子设备可靠性预计手册”，得出的各种元器件包括集成电路芯片工作条件下的可靠性预计数据，有时会和实际情况产生很大的偏差的特点，设计了基于失效机理的可靠性数据确认方法。该确认方法是从超大规模集成电路芯片中的失效机理出发，分析了国内外相关失效机理可靠性评价标准。基于可靠性测试结构，通过单一失效机理的加速寿命试验，得出主要失效机理的中位失效时间。通过中位失效时间与失效率的换算，得出超大规模集成电路的可靠性数据，从物理机制上保证了可靠性数据的有效性。这些可靠性数据可用于航空电子产品的可靠应用，同时也可以支撑电子产品可靠性预计工作。

Targeting the characteristics of GJB/Z 299C-2006 "Reliability Prediction Handbook for Electronic Equipment," where predicted reliability data for various components, including integrated circuit chips under operational conditions, often deviate significantly from actual situations, a failure mechanism-based reliability data validation method has been designed. This validation method starts from the failure mechanisms in very large-scale integrated circuit chips and, based on an analysis of domestic and international standards for evaluating reliability related to failure mechanisms, summarizes the failure physics models in national standards. Leveraging reliability test structures, through accelerated life testing for single failure mechanisms, the median time to failure for primary failure mechanisms is derived. By converting the median time to failure into failure rates, reliability data for very large-scale integrated circuits is obtained, ensuring the validity of the reliability data from a physical mechanism. These reliability data can be applied to the reliable utilization of avionics products while also supporting reliability prediction work for electronic products.