测试系统集成开发环境ETest及其工程应用

陈策

集成电路与嵌入式系统 ›› 2023, Vol. 23 ›› Issue (10) : 3-8.

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PDF(2074 KB)
集成电路与嵌入式系统 ›› 2023, Vol. 23 ›› Issue (10) : 3-8.
专题论述

测试系统集成开发环境ETest及其工程应用

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Test System Integration Development Environment and Applications

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摘要

测试系统是嵌入式系统开发、调试、试验、验收等环节中必不可少的重要保障装备,测试系统集成开发环境可快速实现对系统的开发,发展国产自主可控仿真测试系统集成开发环境是我国工业基础软件发展的重要组成部分。介绍了测试系统集成开发环境ETest的设计理念、系统架构和功能模块。ETest通过测试领域描述语言ETL描述被测设备的交联关系及其接口、信号与协议模板、操作监控面板、测试脚本,具有集成化的测试系统开发能力,可支持1 ms级实时响应。研究了ETest的开发与使用模式,给出了ETest典型应用案例。测试结果表明,ETest在开发面向嵌入式系统半实物测试系统方面具有明显优势,可显著提高开发效率,对于建立国产自主可控的测试系统研发生态具有重要的战略意义。

Abstract

Test system is an essential and important safeguard equipment in the development,debugging,testing,and acceptance of embedded systems.The integrated development environment of the test system can quickly realize the development of the test system.The development of the domestic autonomous and controllable simulation test system integrated development environment is an important part of the development of China's industrial basic software.The design concept,system architecture and function modules of ETest are introduced.ETest can describe the cross-linking relationship,interface,signal and protocol template,operation monitoring panel and test script of the device under test through ETL,which is a test domain description language.ETest has integrated test system development capability and can support 1 ms real-time response performance.The development and use mode of ETest are studied,and the typical application cases of ETest are given.The test results indicate that ETest has significant advantages in developing semi-physical testing systems for embedded systems,significantly improving development efficiency,and has important strategic significance for establishing a domestically produced and controllable testing system research and development ecosystem.

关键词

ETest / 装备软件测试 / 国产自主可控 / ETL

Key words

ETest / home-made autonomous controllable / ETL

引用本文

导出引用
陈策. 测试系统集成开发环境ETest及其工程应用[J]. 集成电路与嵌入式系统. 2023, 23(10): 3-8
Chen Ce. Test System Integration Development Environment and Applications[J]. Integrated Circuits and Embedded Systems. 2023, 23(10): 3-8
中图分类号: TP311.52   

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