介绍了一个在电磁干扰下的MCU失效案例,通过展示一步步的调试分析以及完成多个对比论证实验,在最终寻求到多种解决方案的同时,也深入体验到不同厂家芯片间的差距。文中对Flash等待周期的影响进行了探讨与论述,由于各厂家在其用户手册都未对此做过多的原理与作用上的阐述,很多用户一知半解、生搬硬套,然而这个概念在各种干扰场景下的理解与使用却有着非常重要的作用。
Abstract
In the paper,a case of MCU failure under electromagnetic interference is introduced.Through demonstrating step-by-step debugging analysis and completing multiple comparative demonstration experiments,we can finally find a variety of solutions,and also deeply experience the gap between chips from different manufacturers.The impact of the Flash waiting period is discussed and discussed in a large space in the article.Because the manufacturers have not explained too much about the principle and function of this in their user manuals,many users have a half-understanding of it and apply it mechanically,and the understanding and use of this concept in various interference scenarios plays a very important role.
关键词
MCU /
STM32 /
Flash等待周期 /
电磁干扰
Key words
MCU /
STM32 /
Flash waiting period /
electromagnetic interference
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参考文献
[1] 杨余柳,张叶茂,伦砚波,等.基于ARM Cortex-M3的STM32微控制器实战教程[M].北京:电子工业出版社,2017:63-90.
[2] 沈红卫,任沙浦,朱敏杰,等.STM32单片机应用与案例实践[M].北京:电子工业出版社,2017:1-70.
[3] 帕特里克·G.安德烈.产品设计的电磁兼容故障排除技术[M].崔强,译.北京:机械工业出版社,2019:26-103.
[4] 虞志益,曾晓洋,魏少军.微处理器设计:架构、电路及实现[M].北京:科学出版社,2021:9-90.
[5] 海涛.STM32系列单片机原理及应用[M].北京:机械工业出版社,2022:26-98.
[6] 董磊,赵志刚.STM32F1开发标准教程[M].北京:电子工业出版社,2017:20-96.
[7] 谭浩强.C语言程序设计[M].北京:清华大学出版社,201:20-96.
[8] 杨显清,杨德强.电磁兼容原理与技术[M].北京:电子工业出版社,2020:30-90.
[9] 蔡杏山.模拟电路和数字电路自学手册[M].北京:人民邮电出版社,2018:15-75.