系统级单粒子效应试验方法研究

丁李利; 陈伟; 郭晓强; 张凤祁; 姚志斌; 吴伟

doi:10.20193/j.ices2097-4191.2024.03.005

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集成电路与嵌入式系统 ›› 2024, Vol. 24 ›› Issue (3) : 23-26. DOI: 10.20193/j.ices2097-4191.2024.03.005

航天集成电路研究专栏

系统级单粒子效应试验方法研究

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Study of test method for system-level single event effects

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摘要

为评估星载电子系统抗单粒子效应敏感性及验证系统级加固方法有效性,本文开展了系统级单粒子效应试验方法的相关研究。验证了采用地面模拟装置以逐一辐照系统中器件方式评估系统功能中断率的可行性,提出可通过多种方式获取器件的敏感性数据,指出直接将系统中器件对应的功能中断截面进行加和求取系统截面曲线的不合理之处,本研究为开展系统级单粒子效应试验提供了技术支撑。

Abstract

To evaluate the single event effects vulnerability of electronic systems being used in space environment,and verify the effectiveness of system-level hardening methods against radiation,this article conducts relevant research on system level single event effect testing methods.Feasibility of irradiating devices in electronic systems one by one under laboratory environment to evaluate single event functional interrupt rate is confirmed.It is suggested that many methods could be used to get the vulnerability data of devices.The procedure to directly sum up the cross section value corresponding to each device is pointed out to be not reasonable.Through all the above suggestions,it is able to support the test for system-level single event effects.

导出引用

丁李利, 陈伟, 郭晓强, 等. 系统级单粒子效应试验方法研究[J]. 集成电路与嵌入式系统. 2024, 24(3): 23-26 https://doi.org/10.20193/j.ices2097-4191.2024.03.005

DING Lili, CHEN Wei, GUO Xiaoqiang, et al. Study of test method for system-level single event effects[J]. Integrated Circuits and Embedded Systems. 2024, 24(3): 23-26 https://doi.org/10.20193/j.ices2097-4191.2024.03.005

中图分类号： TN386.1

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