基于通用测试平台的AD73360测试子卡设计

于吉刚; 侯伟盟; 谭加加

doi:10.20193/j.ices2097-4191.2024.05.012

PDF(4350 KB)

集成电路与嵌入式系统 ›› 2024, Vol. 24 ›› Issue (5) : 88-93. DOI: 10.20193/j.ices2097-4191.2024.05.012

研究论文

基于通用测试平台的AD73360测试子卡设计

作者信息 +

Design of AD73360 test sub-card based on universal test platform

Author information +

文章历史 +

摘要

本文基于中国电子科技集团公司第58所现有的ZYNQ+FPGA的ADC通用测试平台对六通道模/数转换器件AD73360进行详细的动态指标测试,数据处理和分析在上位机LabVIEW中调用MATLAB实现。由于采集控制与处理的平台系统已经设计完成,本设计主要针对AD73360子卡的硬件设计、具体的动态测试方法和上位机指标测试进行详细的阐述,通过对比手册给出的典型动态指标,最终确定本课题设计的子卡性能可以满足AD73360的性能指标要求。

Abstract

Based on the existing ZYNQ+FPGA ADC universal testing platform of the 58th China Electronics Technology Group Corporation,this paper carries out a detailed dynamic index test for the six-channel analog-to-digital conversion device AD73360.Data processing and analysis are realized by invoking MATLAB in LabVIEW of upper computer.As a result of the acquisition control and processing system has been designed,the design is mainly for AD73360 slave card's hardware design,concrete dynamic testing methods and PC by detailed test.Through comparing the manual gives typical dynamic index,the slave card performance can satisfy the performance index of AD73360.

导出引用

于吉刚, 侯伟盟, 谭加加. 基于通用测试平台的AD73360测试子卡设计[J]. 集成电路与嵌入式系统. 2024, 24(5): 88-93 https://doi.org/10.20193/j.ices2097-4191.2024.05.012

YU Jigang, HOU Weimeng, TAN Jiajia. Design of AD73360 test sub-card based on universal test platform[J]. Integrated Circuits and Embedded Systems. 2024, 24(5): 88-93 https://doi.org/10.20193/j.ices2097-4191.2024.05.012

中图分类号： TP23 (自动化装置与设备)

参考文献

列表( 原文顺序 | 文献年度倒序 | 文中引用次数倒序 ) 可视化分析

[1]	徐建忠, 罗学金. 无线芯片ADC电路自动测试平台的设计与实现[J]. 集成电路应用, 2018, 35(7):56-59. XU J ZH, LUO X J. Design and implementation of an automatic testing platform for wireless chip ADC circuits[J]. Integrated Circuit Applications, 2018, 35(7):56-59. (in Chinese) 本文引用 [1]

[2]	章若冰. 高精密可调电源的研究与设计[J]. 电子设计工程, 2016, 24(16):155-157. ZHANG R B. Research and Design of High Precision Adjustable Power Supply[J]. Electronic Design Engineering, 2016, 24(16):155-157. (in Chinese) 本文引用 [1]

[3]	赵睿, 马媛. 基于Zynq的数据采集系统的研究与设计[J]. 电子测试, 2016(22):20-21. ZHAO R, MA Y. Research and Design of a Data Acquisition System Based on Zynq[J]. Electronic Testing, 2016(22):20-21. (in Chinese) 本文引用 [1]

[4]	黄朴, 冯洋, 虞致国, 等. 高速高精度ADC动态参数评估系统的设计与实现[J]. 计算机测量与控制, 2016, 24(6):294-297,301. HUANG P, FENG Y, YU ZH G, et al. Design and implementation of a high-speed and high-precision ADC dynamic parameter evaluation system[J]. Computer Measurement and Control, 2016, 24(6):294-297,301. (in Chinese) 本文引用 [1]

[5]	薛亮, 沈廷钊, 张向民. 一种A/D静态参数和动态参数的测试方法[C]// 第二届全国信息获取与处理学术会议, 2004. XUE L, SHEN T ZH, ZHANG X M. A Testing Method for A/D Static and Dynamic Parameters[C]// The Second National Conference on Information Acquisition and Processing, 2004. 本文引用 [1]

[6]	董春雷. 基于基于ADS7821的A/D转换模块设计[J]. 电子技术(上海), 2016(4):63-64,59. (in Chinese) DONG CH L. Design of A/D conversion module based on ADS7821[J]. Electronic Technology (Shanghai), 2016 (4):63-64,59. (in Chinese) 本文引用 [1]