R2-Layout:面向制造良率的已知缺陷驱动版图检索
焦天晟, 刘贤山, 陈晔, 郑飞君
R2-Layout: known-defect-driven layout retrieval for manufacturing yield analysis
Jiao Tiansheng, Liu Xianshan, Chen Ye, Zheng Feijun
集成电路与嵌入式系统
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2026, (11): 62
-70
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DOI: 10.20193/j.ices2097-4191.2026.0089
