FinFET器件的可靠性研究及模型构建
王于波, 曹永万, 郁文, 刘芳, 张同, 朱亚星, 丁国静
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WANG, Yubo, CAO, Yongwan, YU, Wen, LIU, Fang, ZHANG, Tong, ZHU, Yaxing, DING, Guojing
. .  DOI: 10.20193/j.ices2097-4191.2025.0008