电磁干扰环境MOS器件可靠性表征方法研究
朱亚星, 赵东艳, 陈燕宁, 刘芳, 吴波, 王凯, 郁文, 王柏清, 宋斌斌, 连亚军
Research on reliability characterization method for MOS devices under electromagnetic interference environment
ZHU Yaxing, ZHAO Dongyan, CHEN Yanning, LIU Fang, WU Bo, WANG Kai, YU Wen, WANG Baiqing, SONG Binbin, LIAN Yajun
集成电路与嵌入式系统
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2024, (8): 29
-34
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DOI: 10.20193/j.ices2097-4191.2024.0012
