电磁脉冲冲击下工业芯片LDMOS器件可靠性仿真方法研究
朱亚星, 赵东艳, 陈燕宁, 刘芳, 吴波, 王凯, 梁英宗, 郁文, 池泊明, 连亚军
Research on reliability simulation method for industrial-chip-featured LDMOS devices under elctromagntic pulse impact
ZHU Yaxing, ZHAO Dongyan, CHEN Yanning, LIU Fang, WU Bo, WANG Kai, LIANG Yingzong, YU Wen, CHI Boming, LIAN Yajun
集成电路与嵌入式系统
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2024, (10): 25
-30
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DOI: 10.20193/j.ices2097-4191.2024.0030
