集成电路测试机(Automatic Test Equipment,ATE)是用于验证芯片功能与性能的核心设备,传统测试方法存在效率低、精度不足等问题,为此提出一种基于ST3020 ATE测试机的自动测试方案,该设备具备自动化、高效率、高精度、宽量程、高灵活性与良好扩展性等特点。以芯片UC2625为测试对象,通过软件层面编写自动测试代码,硬件层面设计接口板PCB,结合循环测试、数组存储与比对等技术,系统研究了该芯片的逻辑功能与关键参数指标,最终实现了完整的ATE自动测试方案。测试结果与芯片手册规格相符,满足实际测试要求。方案在自动测试方法上进行了有益探索,为我国ATE测试技术的自主发展提供了重要参考。

Automatic Test Equipment (ATE) for integrated circuits is a core device used to verify the functionality and performance of chips. Traditional testing methods suffer from limitations such as low efficiency and insufficient precision. To address these issues, this study proposes an automatic testing scheme based on the ST3020 ATE. This equipment features innovative characteristics including automation, high efficiency, high precision, wide measurement range, strong flexibility, and excellent scalability. Taking the UC2625 chip as the test object, automatic test codes are developed at the software level, and an interface printed circuit board (PCB) is designed at the hardware level. By integrating technologies such as cyclic testing, array storage, and data comparison, a systematic study is conducted on the logical functions and key parameter indicators of the chip, ultimately realizing a complete ATE automatic testing scheme. The test results are consistent with the specifications in the chip datasheet and meet the requirements of practical testing. This scheme conducts valuable explorations in automatic testing methods, provides a reference for the independent development of ATE testing technology in China.