基于UC2625芯片的集成电路自动测试方案
王浚蘅, 张俊昌, 周乐成, 沈祺, 林向阳, 兰馗博
Integrated circuit automatic testing solution based on UC2625 chip
WANG Junheng, ZHANG Junchang, ZHOU Lecheng, SHEN Qi, LIN Xiangyang, LAN Kuibo
集成电路与嵌入式系统
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2026, (3): 48
-53
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DOI: 10.20193/j.ices2097-4191.2025.0115
