Research on reliability characterization method for MOS devices under electromagnetic interference environment

ZHU Yaxing, ZHAO Dongyan, CHEN Yanning, LIU Fang, WU Bo, WANG Kai, YU Wen, WANG Baiqing, SONG Binbin, LIAN Yajun

Integrated Circuits and Embedded Systems ›› 2024, Vol. 24 ›› Issue (8) : 29-34.

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Integrated Circuits and Embedded Systems ›› 2024, Vol. 24 ›› Issue (8) : 29-34. DOI: 10.20193/j.ices2097-4191.2024.0012
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Research on reliability characterization method for MOS devices under electromagnetic interference environment

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2024, 24(8): 29-34 https://doi.org/10.20193/j.ices2097-4191.2024.0012

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