Research on reliability simulation method for industrial-chip-featured LDMOS devices under elctromagntic pulse impact

ZHU Yaxing, ZHAO Dongyan, CHEN Yanning, LIU Fang, WU Bo, WANG Kai, LIANG Yingzong, YU Wen, CHI Boming, LIAN Yajun

Integrated Circuits and Embedded Systems ›› 2024, Vol. 24 ›› Issue (10) : 25-30.

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Integrated Circuits and Embedded Systems ›› 2024, Vol. 24 ›› Issue (10) : 25-30. DOI: 10.20193/j.ices2097-4191.2024.0030
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Research on reliability simulation method for industrial-chip-featured LDMOS devices under elctromagntic pulse impact

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2024, 24(10): 25-30 https://doi.org/10.20193/j.ices2097-4191.2024.0030

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