Research on Fault Automatic Safety Upgrade Technology of Embedded Software

Wu Liangshun, Ying Rendong, Liu Peilin, Zhang Bin

Integrated Circuits and Embedded Systems ›› 2022, Vol. 22 ›› Issue (10) : 29-31.

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Integrated Circuits and Embedded Systems ›› 2022, Vol. 22 ›› Issue (10) : 29-31.
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Research on Fault Automatic Safety Upgrade Technology of Embedded Software

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2022, 22(10): 29-31

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