Design of PCM Telemetry Data Testing System Based on Zynq7020

Sun Xuefei, Ma Keyan, Su Xu, Liu Minxia, Wang Yakai

Integrated Circuits and Embedded Systems ›› 2023, Vol. 23 ›› Issue (8) : 75-78.

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Integrated Circuits and Embedded Systems ›› 2023, Vol. 23 ›› Issue (8) : 75-78.
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Design of PCM Telemetry Data Testing System Based on Zynq7020

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2023, 23(8): 75-78

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