Investigation on radiation-hardened technology of single event effect for power MOSFETs

CHEN Baozhong, SONG Kun, WANG Yingmin, LIU Cunsheng, WANG Xiaohe, ZHAO Hui, XIN Weiping, YANG Lixia, XING Hongyan, WANG Chenjie

Integrated Circuits and Embedded Systems ›› 2024, Vol. 24 ›› Issue (3) : 19-22.

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Integrated Circuits and Embedded Systems ›› 2024, Vol. 24 ›› Issue (3) : 19-22.
Special Topic of Aerospace Integrated Circuits

Investigation on radiation-hardened technology of single event effect for power MOSFETs

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2024, 24(3): 19-22

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