Review on the reliability evaluation of inherent failure mechanism of integrated circuits

ZHANG Xiaowen, ZHOU Bin, NIU Hao, LIN Xiaoling

Integrated Circuits and Embedded Systems ›› 2024, Vol. 24 ›› Issue (7) : 1-11.

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Integrated Circuits and Embedded Systems ›› 2024, Vol. 24 ›› Issue (7) : 1-11.
Special Topic of Integrated Circuits Reliability

Review on the reliability evaluation of inherent failure mechanism of integrated circuits

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2024, 24(7): 1-11

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