Bias voltage and temperature dependence of single-event transient in 22 nm FDSOI devices

HUANG Xiaofeng, LI Chenming, WANG Haibin, SUN Yongshu, WANG Liang, GUO Gang, WANG Xueming

Integrated Circuits and Embedded Systems ›› 2024, Vol. 24 ›› Issue (7) : 30-36.

PDF(4225 KB)
PDF(4225 KB)
Integrated Circuits and Embedded Systems ›› 2024, Vol. 24 ›› Issue (7) : 30-36.
Special Topic of Integrated Circuits Reliability

Bias voltage and temperature dependence of single-event transient in 22 nm FDSOI devices

    {{javascript:window.custom_author_en_index=0;}}
  • {{article.zuoZhe_EN}}
Author information +
History +

HeighLight

{{article.keyPoints_en}}

Abstract

{{article.zhaiyao_en}}

Key words

QR code of this article

Cite this article

EndNote

Ris (Procite)

Bibtex

Download Citations
{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2024, 24(7): 30-36

References

Publishing order | Descend order by publishing year | Descend order by cited within

References

{{article.reference}}

Funding

RIGHTS & PERMISSIONS

{{article.copyrightStatement_en}}
{{article.copyrightLicense_en}}
PDF(4225 KB)

Accesses

Citation

Detail
Sections
Recommended

/

〈 〉