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Applications and major challenges of glass core substrate for chiplet integration
CHEN Changhao, XU Shimeng, LIN Pengrong
Integrated Circuits and Embedded Systems ›› 2025, Vol. 25 ›› Issue (9) : 1-13.
PDF(33463 KB)
PDF(33463 KB)
Applications and major challenges of glass core substrate for chiplet integration
The growing demand for massive data processing such as artificial intelligence has greatly promoted the development of chiplet integration technology, which further imposes technical requirements on FC-BGA substrates, including large size, low warpage, electrical performance and high reliability. The late-model glass core substrate has attracted extensive attention owing to its intrinsic low dielectric coefficient, high thermal stability and chemical inertness. However, current glass core substrate technology remains in the initial stage of mass production, lacking comprehensive, reliable and standardized methods of producation, application and testing. This article overviews the history, characteristics, and present challenges of glass core substrate. It also provides a summary and prospect on the future applications of glass core substrate in chiplet integration.
chiplet integration / glass core substrate / through glass vias
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Stress Issues in 3D Interconnect Technology Using Through Glass Vias[J]. Journal of Mechanical Engineering, 2022, 58(2):246.
At present, the three-dimensional (3D) interconnection technology based on glass through vias (TGVs) has been applied to integration passive devices, three-dimensional packaging and optoelectronic device integration because of its excellent electrical and optical properties, good mechanical stability and low-cost. However, the thermal stress caused by the mismatch of thermal expansion coefficients among multi-materials structure and the complex structure of TGV would affect the performance and reliability of the device. In view of this, many scholars have carried out relevant studies. The stress issues in 3D interconnect technology using TGVs are reviewed at home and abroad survey. Thermal stress theoretical models are constructed, the mechanism of size and distribution of stress is summarized for the filled and unfilled copper of the TGVs. The local stress concentration would induce serious thermo and mechanical reliability. Secondly, after times of finite element model analysis, it is concluded that filling polymer in the vias would alleviate the residual stress. Finally, put forward some problems to be solved urgently.
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