Investigation on radiation-hardened technology of single event effect for power MOSFETs
CHEN Baozhong, SONG Kun, WANG Yingmin, LIU Cunsheng, WANG Xiaohe, ZHAO Hui, XIN Weiping, YANG Lixia, XING Hongyan, WANG Chenjie
Integrated Circuits and Embedded Systems
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2024, (3): 19
-22
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