Research on reliability simulation method for industrial-chip-featured LDMOS devices under elctromagntic pulse impact
ZHU Yaxing, ZHAO Dongyan, CHEN Yanning, LIU Fang, WU Bo, WANG Kai, LIANG Yingzong, YU Wen, CHI Boming, LIAN Yajun
Integrated Circuits and Embedded Systems
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2024, (10): 25
-30
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DOI: 10.20193/j.ices2097-4191.2024.0030
