Design of AD73360 test sub-card based on universal test platform

YU Jigang, HOU Weimeng, TAN Jiajia

Integrated Circuits and Embedded Systems ›› 2024, Vol. 24 ›› Issue (5) : 88-93.

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Integrated Circuits and Embedded Systems ›› 2024, Vol. 24 ›› Issue (5) : 88-93. DOI: 10.20193/j.ices2097-4191.2024.05.012
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Design of AD73360 test sub-card based on universal test platform

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2024, 24(5): 88-93 https://doi.org/10.20193/j.ices2097-4191.2024.05.012

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