Research on reliability evaluation standards for system-in-package on physics-of-failure

LIU Yingying, WANG Zhihui, LIU Wenbao, FU Wanyue, LIU Pei

Integrated Circuits and Embedded Systems ›› 2025, Vol. 25 ›› Issue (11) : 54-61.

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Integrated Circuits and Embedded Systems ›› 2025, Vol. 25 ›› Issue (11) : 54-61. DOI: 10.20193/j.ices2097-4191.2025.0055
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Research on reliability evaluation standards for system-in-package on physics-of-failure

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2025, 25(11): 54-61 https://doi.org/10.20193/j.ices2097-4191.2025.0055

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