An efficient DDR4 debugging and testing method for SoC designs

JIANG Yande, MA Jingbo, ZHANG Guangda, WANG Dongsheng, XU Shi, PEI Bingxi, WANG Huiquan

Integrated Circuits and Embedded Systems ›› 2025, Vol. 25 ›› Issue (11) : 31-37.

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Integrated Circuits and Embedded Systems ›› 2025, Vol. 25 ›› Issue (11) : 31-37. DOI: 10.20193/j.ices2097-4191.2025.0069
Special Topic of Microprocessor Technology

An efficient DDR4 debugging and testing method for SoC designs

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2025, 25(11): 31-37 https://doi.org/10.20193/j.ices2097-4191.2025.0069

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