Automatic Test Equipment (ATE) for integrated circuits is a core device used to verify the functionality and performance of chips. Traditional testing methods suffer from limitations such as low efficiency and insufficient precision. To address these issues, this study proposes an automatic testing scheme based on the ST3020 ATE. This equipment features innovative characteristics including automation, high efficiency, high precision, wide measurement range, strong flexibility, and excellent scalability. Taking the UC2625 chip as the test object, automatic test codes were developed at the software level, and an interface printed circuit board (PCB) was designed at the hardware level. By integrating technologies such as cyclic testing, array storage, and data comparison, a systematic study was conducted on the logical functions and key parameter indicators of the chip, ultimately realizing a complete ATE automatic testing scheme. The test results are consistent with the specifications in the chip datasheet and meet the requirements of practical testing. This scheme conducts valuable explorations in automatic testing methods, provides a reference for the independent development of ATE testing technology in China, contributes to promoting the construction of the semiconductor testing industry, and supports the technological self-reliance and self-improvement in China's integrated circuit field.