Design and Application of General Purpose Board Chip Test System

Wang Huimin, Li Yonghong, Yue Fengying, Zhang Lun

Integrated Circuits and Embedded Systems ›› 2023, Vol. 23 ›› Issue (1) : 88-91.

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Integrated Circuits and Embedded Systems ›› 2023, Vol. 23 ›› Issue (1) : 88-91.
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Design and Application of General Purpose Board Chip Test System

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2023, 23(1): 88-91

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