Design of Embedded Testing System Based on STM32F407 and FreeRTOS

Tian Ye

Integrated Circuits and Embedded Systems ›› 2023, Vol. 23 ›› Issue (11) : 54-58.

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Integrated Circuits and Embedded Systems ›› 2023, Vol. 23 ›› Issue (11) : 54-58.
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Design of Embedded Testing System Based on STM32F407 and FreeRTOS

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2023, 23(11): 54-58

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