High Reliability Storage Scheme for Embedded Devices Based on Power-off Interrupt

Fan Bo, Wang Shuai

Integrated Circuits and Embedded Systems ›› 2023, Vol. 23 ›› Issue (12) : 19-22.

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Integrated Circuits and Embedded Systems ›› 2023, Vol. 23 ›› Issue (12) : 19-22.
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High Reliability Storage Scheme for Embedded Devices Based on Power-off Interrupt

  • Fan Bo, Wang Shuai
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Abstract

Embedded devices typically build data storage solutions based on Flash memory and TFFS file systems.This article proposes a data storage optimization scheme based on power outage interrupt to address their storage performance and reliability issues.This scheme caches frequently changing data in memory and only writes cached data to files when the device is powered down,minimizing the number of Flash writes and avoiding the possibility of inconsistent file system metadata caused by device power failure,thereby improving device storage reliability and extending the lifespan of the Flash chip.

Key words

embedded devices / Flash / TFFS file system

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Fan Bo, Wang Shuai. High Reliability Storage Scheme for Embedded Devices Based on Power-off Interrupt[J]. Integrated Circuits and Embedded Systems. 2023, 23(12): 19-22

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