High Reliability Storage Scheme for Embedded Devices Based on Power-off Interrupt

Fan Bo, Wang Shuai

Integrated Circuits and Embedded Systems ›› 2023, Vol. 23 ›› Issue (12) : 19-22.

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Integrated Circuits and Embedded Systems ›› 2023, Vol. 23 ›› Issue (12) : 19-22.
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High Reliability Storage Scheme for Embedded Devices Based on Power-off Interrupt

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2023, 23(12): 19-22

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