An Improved MTBF-T Model for Reliability Evaluation of Electronic Equipment

Wei Jiangying, Dong Yijun, Liu Zhenxiang

Integrated Circuits and Embedded Systems ›› 2023, Vol. 23 ›› Issue (12) : 63-66.

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Integrated Circuits and Embedded Systems ›› 2023, Vol. 23 ›› Issue (12) : 63-66.
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An Improved MTBF-T Model for Reliability Evaluation of Electronic Equipment

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2023, 23(12): 63-66

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