Single-event effect and Nbuffer hardening for NLDMOS device

YANG Qiang, GE Chaoyang, LI Yanfei, XIE Rubin, HONG Genshen

Integrated Circuits and Embedded Systems ›› 2024, Vol. 24 ›› Issue (3) : 13-18.

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Integrated Circuits and Embedded Systems ›› 2024, Vol. 24 ›› Issue (3) : 13-18.
Special Topic of Aerospace Integrated Circuits

Single-event effect and Nbuffer hardening for NLDMOS device

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2024, 24(3): 13-18

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