Study of test method for system-level single event effects

DING Lili, CHEN Wei, GUO Xiaoqiang, ZHANG Fengqi, YAO Zhibin, WU Wei

Integrated Circuits and Embedded Systems ›› 2024, Vol. 24 ›› Issue (3) : 23-26.

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Integrated Circuits and Embedded Systems ›› 2024, Vol. 24 ›› Issue (3) : 23-26.
Special Topic of Aerospace Integrated Circuits

Study of test method for system-level single event effects

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2024, 24(3): 23-26

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