Integrated Circuits and Embedded Systems

Figure/Table detail

Research on reliability simulation method for industrial-chip-featured LDMOS devices under elctromagntic pulse impact

ZHU Yaxing, ZHAO Dongyan, CHEN Yanning, LIU Fang, WU Bo, WANG Kai, LIANG Yingzong, YU Wen, CHI Boming, LIAN Yajun

Integrated Circuits and Embedded Systems, 2024, 24(10): 25-30. DOI: 10.20193/j.ices2097-4191.2024.0030

Fig. 5 Reliability degradation simulation of the given LDMOS device

Other figure/table from this article

Fig.1 Typical electromagnetic interference signal acquisition and analysis in industrial chip environments
Fig. 2 Time-domain probability density
Fig. 3 Conversion of a complex electromagnetic interference signal to the rectangular pulse signal
Fig. 4 Device simulation with electromagnetic boundary conditions