Figure/Table detail

Research on reliability evaluation standards for system-in-package on physics-of-failure
LIU Yingying, WANG Zhihui, LIU Wenbao, FU Wanyue, LIU Pei
Integrated Circuits and Embedded Systems, 2025, 25(11): 54-61.   DOI: 10.20193/j.ices2097-4191.2025.0055

时间
/h		 高电平
电压/V		 电源
电流/A		 时间
/h		 高电平
电压/V		 电源
电流/A
0 0.235 3 0.235 8 336 0.298 3 0.241 8
24 0.228 1 0.253 8 360 0.325 8 0.421 0
48 0.236 8 0.235 8 384 0.378 1 0.271 8
72 0.278 1 0.198 2 408 0.214 5 0.328 7
96 0.253 4 0.234 8 432 0.236 8 0.413 2
120 0.257 8 0.236 8 456 0.204 0 0.354 7
144 0.183 7 0.352 4 480 0.354 7 0.397 8
168 0.289 3 0.235 8 504 0.367 8 0.258 7
192 0.312 8 0.198 6 528 0.412 3 0.423 5
216 0.338 7 0.199 0 552 0.453 2 0.325 7
240 0.378 1 0.289 7 576 0.381 7 0.453 8
264 0.298 3 0.321 2 600 0.358 7 0.521 4
288 0.358 7 0.312 5 624 0.421 2 0.327 4
312 0.387 6 0.398 2 648 0.398 0 0.521 4
Table 1 Normalized characteristic parameters of sip module(range transformation)
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