An efficient DDR4 debugging and testing method for SoC designs
JIANG Yande, MA Jingbo, ZHANG Guangda, WANG Dongsheng, XU Shi, PEI Bingxi, WANG Huiquan
Integrated Circuits and Embedded Systems . 2025, (11): 31 -37 .  DOI: 10.20193/j.ices2097-4191.2025.0069