Research on reliability evaluation standards for system-in-package on physics-of-failure
LIU Yingying, WANG Zhihui, LIU Wenbao, FU Wanyue, LIU Pei
Integrated Circuits and Embedded Systems . 2025, (11): 54 -61 .  DOI: 10.20193/j.ices2097-4191.2025.0055